RADIATION EFFECTS ON COMPONENTS & SYSTEMS
Online Event 19th October to 20th November 2020
The RADECS 2020 Conference is soliciting papers describing significant new findings or developments in the following areas:
Basic Mechanisms of Radiation Effects
Ionizing dose – Non ionizing dose/Displacement damage – Effects on materials & advanced device structures – Radiation transport, energy deposition and dosimetry – Cryogenic or high temperature effects.
Radiation Effects on Devices & ICs
Ionizing dose – Non ionizing dose/Displacement damage – Synergy with Single Event Effects – Modelling and characterization of devices, circuits and systems responses.
Single Event Effects: Mechanisms & Modelling
Single-Event charge collection phenomena and mechanisms – Modelling at device, circuit or system level.
Single Event Effects: Devices & ICs
Single-Event Effects specific modelling and characterization of devices, circuits and systems – Rate prediction.
Photonics, Optoelectronics & Sensors
Optoelectronic and optical materials, devices and systems – Sensors – MEMs.
HARDENING & HARDNESS ASSURANCE
Methods for hardened design and/or manufacturing at component, circuit and system level.
Radiation Hardness Assurance
New testing techniques – Hardness assurance methodology – Low cost RHA – COTS qualification – Field return.
RADIATION ENVIRONMENTS AND FACILITIES
Space environments and weather – Atmospheric and ground-level environments – Accelerator, medical and nuclear environments – Characterization and modelling – In-flight experiments.