RADECS Association RADIATION EFFECTS ON COMPONENTS & SYSTEMS CONFERENCE 2020 Online Event 19th October to 20th November 2020

The RADECS 2020 Conference is soliciting papers describing significant new findings or developments in the following areas:


  • Basic Mechanisms of Radiation Effects

    Ionizing dose – Non ionizing dose/Displacement damage – Effects on materials & advanced device structures – Radiation transport, energy deposition and dosimetry – Cryogenic or high temperature effects.

  • Radiation Effects on Devices & ICs

    Ionizing dose – Non ionizing dose/Displacement damage – Synergy with Single Event Effects – Modelling and characterization of devices, circuits and systems responses.

  • Single Event Effects: Mechanisms & Modelling

    Single-Event charge collection phenomena and mechanisms – Modelling at device, circuit or system level.

  • Single Event Effects: Devices & ICs

    Single-Event Effects specific modelling and characterization of devices, circuits and systems – Rate prediction.

  • Photonics, Optoelectronics & Sensors

    Optoelectronic and optical materials, devices and systems – Sensors – MEMs.


  • Hardening Techniques

    Methods for hardened design and/or manufacturing at component, circuit and system level.

  • Radiation Hardness Assurance

    New testing techniques – Hardness assurance methodology – Low cost RHA – COTS qualification – Field return.


  • Radiation Environments

    Space environments and weather – Atmospheric and ground-level environments – Accelerator, medical and nuclear environments – Characterization and modelling – In-flight experiments.

  • Facilities and Dosimetry

    Radiation exposure facilities – Instrumentation methods – Dosimetry.


  • Evaluation/qualification data with complete identification of tested devices.


Interested? Contact us for information !

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