Ionizing dose – Non ionizing dose/Displacement damage – Effects on materials & advanced device structures – Radiation transport, energy deposition and dosimetry – Cryogenic or high temperature effects.

Ionizing dose – Non ionizing dose/Displacement damage – Synergy with Single Event Effects – Modelling and characterization of devices, circuits and systems responses.

Single-Event charge collection phenomena and mechanisms – Modelling at device, circuit or system level.

Single-Event Effects specific modelling and characterization of devices, circuits and systems – Rate prediction.

Optoelectronic and optical materials, devices and systems – Sensors – MEMs.

Methods for hardened design and/or manufacturing at component, circuit and system level.

New testing techniques – Hardness assurance methodology – Low cost RHA – COTS qualification – Field return.

Space environments and weather – Atmospheric and ground-level environments – Accelerator, medical and nuclear environments – Characterization and modelling – In-flight experiments.

Radiation exposure facilities – Instrumentation methods – Dosimetry.

Evaluation/qualification data with complete identification of tested devices.